LXI为实现更高智能仪器开路（英文）
The trend toward more intelligent instruments has become increasingly evident as vendors of test and measurement equipment take advantage of increased processing power to expand the features and functions their products provide.
用4200-CVU电容-电压单位测量电感
Although the 4200-CVU capacitance option for Keithley’s Model 4200 Semiconductor Characterization System does not measure inductance directly, users can easily extract the inductance from the parameters it does measure
4200-SCS演示与新用户培训
Instructions to view the 4200-SCS demo: 1.Unzip the attached “4200-SCS_Intro.zip” folder. The “4200-SCS_Intro” folder has two files (4200-SCS_Intro.htm & 4200-SCS_Intro.swf)
Setting the Timeout in an IVI Driver
The default timeout value for all Keithley IVI-COM drivers is two seconds (2000ms). This generally allows sufficient time to make a connection with an instrument and for a command-and-response-style configuration of the instrument.
2897 Comparing a Series 7000 SCPI Application to a Series 3700 Script
For many years, instrument manufacturers have used “Standard Commands for Programmable Instrumentation” or SCPI to con-trol programmable test and measurement devices in instrumentation system.
利用吉时利4200-SCS型半导体特性分析系统进行电荷泵测量(英文)
Charge pumping (CP) is a well-known measurement technique for analyzing the semiconductor–dielectric interface of MOS structures.
全新一代简单、可靠、完备的极速I-V测试方案(英文)
Ultra-Fast I-V Module for the Model 4200-SCS
了解基于直流、射频和光的开关和控制方案
Keithley’s Switching Systems Switch and control solutions for DC, RF, and light
了解最新LED测试方法以实现更高的准确度、可靠性和经济效益（一）
Using Forward Voltage to Measure Semiconductor Junction Temperature
了解最新LED测试方法以实现更高的准确度、可靠性和经济效益（二）
High Speed Testing of High Brightness LEDs
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