LXI为实现更高智能仪器开路(英文)

发布时间:2014-2-26 15:44    发布者:eechina
关键词: LXI , 智能仪器
The trend toward more intelligent instruments has become increasingly evident as vendors of test and measurement equipment take advantage of increased processing power to expand the features and functions their products provide. These include advanced data analysis and reduction, more sophisticated sequencing and control, and built-in functions targeted at specific T&M applications. This paper details how the capabilities included in the LXI (LAN eXtensions for Instrumentation) Standard
enhance and accelerate the trend toward smarter instruments. It examines how the new generation of LXI smart instruments will lower the total cost of test while improving performance, increasing flexibility, and enhancing ease of use.

下载: 201401123.pdf (103.17 KB)

本文地址:https://www.eechina.com/thread-127074-1-1.html     【打印本页】

本站部分文章为转载或网友发布,目的在于传递和分享信息,并不代表本网赞同其观点和对其真实性负责;文章版权归原作者及原出处所有,如涉及作品内容、版权和其它问题,我们将根据著作权人的要求,第一时间更正或删除。
您需要登录后才可以发表评论 登录 | 立即注册

厂商推荐

相关视频

关于我们  -  服务条款  -  使用指南  -  站点地图  -  友情链接  -  联系我们
电子工程网 © 版权所有   京ICP备16069177号 | 京公网安备11010502021702
快速回复 返回顶部 返回列表