惠普4145B半导体测试仪HP4145B欧群佩133-1696-7555

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深圳佳捷伦电子仪器有限公司

联系人：欧阳群佩/欧阳璋

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Agilent 4155B-060Agilent 4155B-060Semiconductor Parameter AnalyzerThe 4155B Semiconductor Parameter Analyzer is a stand-alone instrument capable of complete dc characterization of semiconductor devices and materials. It stimulates voltage and current sensitive devices, measures the resulting current and voltage response, and displays the results in a user-selectable format (graph, list, matrix or schmoo) on a built-in CRT display.Features:High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1V to 200 VFully-automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUsSynchronized stress/measure function, two high-voltage pulse generator units (40 V)Time-domain measurement: 60s variable intervals, up to 10,001 pointsEasy to use: knob-sweep similar to curve tracer, automatic analysis functionsAutomation: built-in HP Instrument BASIC, trigger I/O capabilityOptions:050 = 50Hz line frequency 50Hz line frequency For 50Hz line frequency.060 = 60Hz line frequency 60Hz line frequency For 60Hz line frequency. KEYSIGHT 8163a,8164a,81618a,81619a,81624b,81623a,81623b,81625a,81521b,81533b,81525a,8156a,81576a,81570a,81578a, 

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