利用吉时利2450型触摸屏数字源表实现可充电电池的充电/放电循环
用于半导体可靠性的短脉冲强制性测试
开发IC让它能工作是一回事；而让它耐用就是另一回事了。随着新技术出现新的可靠性问题，后者变得越来越难。在封装之前，在晶圆上进行脉冲测试会有帮助。
半导体参数测试创新平台ACS
Challenge and Solution Semiconductor Parametric Testing ACS Innovation Platform
霍尔效应测量基础
什么是HALL效应? HALL 测试主要适用与哪些材料,是什么驱使要做HALL测试,哪些人会用到HALL测试?
霍尔效应测量方案
Keithley capability for Hall Effect measurements
面向研发实验室的最新测量方法
New Test Methods for the r&d Lab Learn how to solve 2009’s toughest electrical measurement problems
迎接纳米测试挑战，最全的纳米测量攻略
Keithley is helping advance the state of the art in a growing list ofnanotechnology applications—yours may be one of them. Six decades of experience in designing ultra-sensitive measurement tools allow us to provide university
从I-V测量设备获取更高电流的方法（英文）
The most flexible test equipment for sourcing and measuring current (I) and voltage (V) are source-measure units (SMUs) such as Keithley’s Series 2600A System SourceMeter
为大学半导体制造实验室设计特性分析系统（英文）
Virginia Polytechnic Institute and State University recently opened an 1,800 sq. ft. Class 10,000 cleanroom. This cleanroom is designed to help undergraduates learn the elements of the microchip fabrication process over the course of one semester and to e
用于光电I-V测试的数字源表（英文）
The SourceMeter family was developed specifically for test applications that demand tightly coupled precision voltage and current sourcing and concurrent measurement,including source read back.
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